IMNS Silicon-AFM-Probes

IMNS Silicon-AFM-Probes provide the well-known features of the convenient AFM probes such as
high application versatility and compatibility with most commercial AFMs with a small reproducible
tip radius and a more well-defined tip shape. The typical tip radius of less than 10 nm and the
minimized variation in tip shape provide more reproducible images and enhanced resolution.

General Info:

IMNS Silicon-AFM-probes are manufactured from highly doped, single crystal silicon without any
intrinsic mechanical stress. Its low resistivity of 0.002-0.004 ohm/cm avoids electrostatic charging
of the probe. The monolithic fabricated probes lead to an absolutely straight cantilever without any
bending. Gold backside coating provides the high reflective chemistry stable layer that improves
reflectivity 2.5 times in comparison with uncoated probes. The chemical inertness allows application
in fluids or electrochemical cells. The tip is pointing into the <100> crystal direction.

Tip Features

Total tip shape is tetrahedral
Tip radius is typically 5-10 nm
Tip height is 10 – 15 µm
Tip offset: 5 – 20 µm

Cantilever Features

Backside width is given in probes Specification
Available for contact, non-contact, Semicontact mode.
Tip is set on the controlled distance 5-20 um from the free cantilever end.

Coatings

Au coating on detector side 70 nm thick layer of gold which enhances the
reflectivity of the laser beam by a factor of about 2.5.
Au coating on both sides 70 nm thick layer of gold on both sides of the cantilever.
Magnetic coating for the visualization of magnetic domains selected Magnetic Probes
with different hard and soft magnetic coatings are offered (refer to Magnetic probes).

Scanning Result